Effects of interlayer electrode thickness in Nb/(MoSi2/Nb)N stacked Josephson junctions

Yonuk Chong; P. D. Dresselhaus; S. P. Benz; J. E. Bonevich

doi:10.1063/1.1566797

Effects of interlayer electrode thickness in Nb/(MoSi₂/Nb)_N stacked Josephson junctions

Yonuk Chong
, P. D. Dresselhaus
, S. P. Benz
, J. E. Bonevich

National Institute of Standards and Technology

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

The measurements of the uniformly and reproducibility of Nb/((MoSi₂/Nb)_N vertically stacked junctions, that clarify the superconducting properties of the middle Nb superconducting electrode, was discussed. It was found that the middle electrode thicknesses down to 20 nm showed minimal suppression of the superconducting order parameter as measured through the critical current density. The role of the superconducting coherence length in the arrays of high-density junctions was also elaborated.

Original language	English
Pages (from-to)	2467-2469
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	15
DOIs	https://doi.org/10.1063/1.1566797
State	Published - 14 Apr 2003
Externally published	Yes

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abstract = "The measurements of the uniformly and reproducibility of Nb/((MoSi2/Nb)N vertically stacked junctions, that clarify the superconducting properties of the middle Nb superconducting electrode, was discussed. It was found that the middle electrode thicknesses down to 20 nm showed minimal suppression of the superconducting order parameter as measured through the critical current density. The role of the superconducting coherence length in the arrays of high-density junctions was also elaborated.",

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AU - Chong, Yonuk

AU - Dresselhaus, P. D.

AU - Benz, S. P.

AU - Bonevich, J. E.

PY - 2003/4/14

Y1 - 2003/4/14

N2 - The measurements of the uniformly and reproducibility of Nb/((MoSi2/Nb)N vertically stacked junctions, that clarify the superconducting properties of the middle Nb superconducting electrode, was discussed. It was found that the middle electrode thicknesses down to 20 nm showed minimal suppression of the superconducting order parameter as measured through the critical current density. The role of the superconducting coherence length in the arrays of high-density junctions was also elaborated.

AB - The measurements of the uniformly and reproducibility of Nb/((MoSi2/Nb)N vertically stacked junctions, that clarify the superconducting properties of the middle Nb superconducting electrode, was discussed. It was found that the middle electrode thicknesses down to 20 nm showed minimal suppression of the superconducting order parameter as measured through the critical current density. The role of the superconducting coherence length in the arrays of high-density junctions was also elaborated.

UR - https://www.scopus.com/pages/publications/0038326648

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DO - 10.1063/1.1566797

M3 - Article

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Effects of interlayer electrode thickness in Nb/(MoSi₂/Nb)_N stacked Josephson junctions

Abstract

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