Abstract
We investigate the channel length ( {L} ) scaling effects on the signal-To-noise ratio (SNR) of the field-effect-Transistor (FET)-Type gas sensor with a horizontal floating-gate. A sensing layer, 15 nm of indium-gallium-zinc-oxide thin film, is deposited by the radio frequency sputtering method. Nitrogen dioxide is used as a target gas. The low-frequency noise characteristics of the FET-Type gas sensor are explained by the carrier number fluctuation model with correlated mobility fluctuation. The SNR is proportional to the square root of the {L} of the FET transducer. The result provides important guidelines in designing the sensor platform in FET-Type gas sensors.
| Original language | English |
|---|---|
| Pages (from-to) | 442-445 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 43 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 Mar 2022 |
| Externally published | Yes |
Keywords
- Gas sensors
- IGZO
- low-frequency noise (LFN)
- NOâ Â
- signal-To-noise ratio (SNR)
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