Effect of oxygen and diborane gas ratio on P-type amorphous silicon suboxides layer

  • Jinjoo Park
  • , Seungman Park
  • , Sunwha Lee
  • , Youngkuk Kim
  • , Chonghoon Shin
  • , Seungsin Baek
  • , Daeyeong Gong
  • , Junsin Yi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report on the electrical and optical characterization of a-SiOx thin films prepared using silane and diluted N2O by Helium for PECVD on glass and silicon substrates. In a thin film solar cell, the p-type layer should have a high Eopt to minimize optical absorption, as well as high conductivity for improved cell efficiency. We adjusted Eopt of the p-type layer by varying the N2O and B2H6 gas ratio. The p-type a-SiOx films have the Eopt values of about 1.99 eV.

Original languageEnglish
Title of host publication10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010
Pages687-688
Number of pages2
StatePublished - 2010
Event10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 - Seoul, Korea, Republic of
Duration: 11 Oct 201015 Oct 2010

Publication series

NameProceedings of International Meeting on Information Display
ISSN (Print)1738-7558

Conference

Conference10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010
Country/TerritoryKorea, Republic of
CitySeoul
Period11/10/1015/10/10

Keywords

  • Amorphous silicon sub-oxide thin films
  • BH
  • NO
  • PECVD

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