Abstract
We report on the electrical and optical characterization of a-SiOx thin films prepared using silane and diluted N2O by Helium for PECVD on glass and silicon substrates. In a thin film solar cell, the p-type layer should have a high Eopt to minimize optical absorption, as well as high conductivity for improved cell efficiency. We adjusted Eopt of the p-type layer by varying the N2O and B2H6 gas ratio. The p-type a-SiOx films have the Eopt values of about 1.99 eV.
| Original language | English |
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| Title of host publication | 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 |
| Pages | 687-688 |
| Number of pages | 2 |
| State | Published - 2010 |
| Event | 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 - Seoul, Korea, Republic of Duration: 11 Oct 2010 → 15 Oct 2010 |
Publication series
| Name | Proceedings of International Meeting on Information Display |
|---|---|
| ISSN (Print) | 1738-7558 |
Conference
| Conference | 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Seoul |
| Period | 11/10/10 → 15/10/10 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Amorphous silicon sub-oxide thin films
- BH
- NO
- PECVD
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