Effect of electrical aging on reliability of solution in organic light emitting diode

Hyun Ae Park; Sung Ho Choi; Byoung Deog Choi; Sun Hee Lee; Won Jun Song; Sung Chul Kim

doi:10.1002/j.2168-0159.2012.tb06103.x

Effect of electrical aging on reliability of solution in organic light emitting diode

Hyun Ae Park, Sung Ho Choi, Byoung Deog Choi, Sun Hee Lee, Won Jun Song, Sung Chul Kim

Department of Electronic and Electrical Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

We applied voltage on fabricated OLED with electrical aging in order to investigate the reliability of OLEDs. According to aging times, the decrease of initial capacitance by electrical stress because of the increasing the series resistance and decreasing the carrier doping density of emission states caused by moving fixed charge.

Original language	English
Pages (from-to)	1523-1526
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	43
Issue number	1
DOIs	https://doi.org/10.1002/j.2168-0159.2012.tb06103.x
State	Published - 2012
Event	49th SID International Symposium, Seminar and Exhibition, dubbed Display Week, 2012 - Boston, United States Duration: 3 Jun 2012 → 8 Jun 2012

Access to Document

10.1002/j.2168-0159.2012.tb06103.x

Cite this

@article{ab98369c5d5d48309cc7cd7636dbd9ef,

title = "Effect of electrical aging on reliability of solution in organic light emitting diode",

abstract = "We applied voltage on fabricated OLED with electrical aging in order to investigate the reliability of OLEDs. According to aging times, the decrease of initial capacitance by electrical stress because of the increasing the series resistance and decreasing the carrier doping density of emission states caused by moving fixed charge.",

author = "Park, \{Hyun Ae\} and Choi, \{Sung Ho\} and Choi, \{Byoung Deog\} and Lee, \{Sun Hee\} and Song, \{Won Jun\} and Kim, \{Sung Chul\}",

note = "Publisher Copyright: {\textcopyright} 2012 SID.; 49th SID International Symposium, Seminar and Exhibition, dubbed Display Week, 2012 ; Conference date: 03-06-2012 Through 08-06-2012",

year = "2012",

doi = "10.1002/j.2168-0159.2012.tb06103.x",

language = "English",

volume = "43",

pages = "1523--1526",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

publisher = "John Wiley and Sons Inc",

number = "1",

}

TY - JOUR

T1 - Effect of electrical aging on reliability of solution in organic light emitting diode

AU - Park, Hyun Ae

AU - Choi, Sung Ho

AU - Choi, Byoung Deog

AU - Lee, Sun Hee

AU - Song, Won Jun

AU - Kim, Sung Chul

PY - 2012

Y1 - 2012

N2 - We applied voltage on fabricated OLED with electrical aging in order to investigate the reliability of OLEDs. According to aging times, the decrease of initial capacitance by electrical stress because of the increasing the series resistance and decreasing the carrier doping density of emission states caused by moving fixed charge.

AB - We applied voltage on fabricated OLED with electrical aging in order to investigate the reliability of OLEDs. According to aging times, the decrease of initial capacitance by electrical stress because of the increasing the series resistance and decreasing the carrier doping density of emission states caused by moving fixed charge.

UR - https://www.scopus.com/pages/publications/85075647592

U2 - 10.1002/j.2168-0159.2012.tb06103.x

DO - 10.1002/j.2168-0159.2012.tb06103.x

M3 - Conference article

AN - SCOPUS:85075647592

SN - 0097-966X

VL - 43

SP - 1523

EP - 1526

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

T2 - 49th SID International Symposium, Seminar and Exhibition, dubbed Display Week, 2012

Y2 - 3 June 2012 through 8 June 2012

ER -

Effect of electrical aging on reliability of solution in organic light emitting diode

Abstract

Access to Document

Other files and links

Fingerprint

Cite this