Abstract
The effect of a Pd layer on the interfacial reaction in Sn-3. 5Ag/Pd/Cu was studied by varying the thickness of the Pd layer. The formation of PdSn 4, (Pd 1-xCu x)Sn 4, and (Cu 1-yPd y) 6Sn 5 intermetallic compounds (IMCs), along with CuSn IMCs, was observed. The Sn-3. 5Ag/Pd/Cu structure did not suppress the growth of the (Cu 1-yPd y) 6Sn 5 IMCs, but the growth of Cu 3Sn IMCs was inhibited by the presence of a 200- to 600-nm-thick Pd layer.
| Original language | English |
|---|---|
| Pages (from-to) | 1263-1266 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 61 |
| Issue number | 8 |
| DOIs | |
| State | Published - Oct 2012 |
Keywords
- Intermetallic compounds
- Lead-free solder
- Pd sacrifice layer
- Thermal aging
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