Skip to main navigation Skip to search Skip to main content

Effect of a Pd sacrifice layer on the interfacial reaction in Sn-3.5Ag/Pd/Cu

  • Sungkyunkwan University

Research output: Contribution to journalArticlepeer-review

Abstract

The effect of a Pd layer on the interfacial reaction in Sn-3. 5Ag/Pd/Cu was studied by varying the thickness of the Pd layer. The formation of PdSn 4, (Pd 1-xCu x)Sn 4, and (Cu 1-yPd y) 6Sn 5 intermetallic compounds (IMCs), along with CuSn IMCs, was observed. The Sn-3. 5Ag/Pd/Cu structure did not suppress the growth of the (Cu 1-yPd y) 6Sn 5 IMCs, but the growth of Cu 3Sn IMCs was inhibited by the presence of a 200- to 600-nm-thick Pd layer.

Original languageEnglish
Pages (from-to)1263-1266
Number of pages4
JournalJournal of the Korean Physical Society
Volume61
Issue number8
DOIs
StatePublished - Oct 2012

Keywords

  • Intermetallic compounds
  • Lead-free solder
  • Pd sacrifice layer
  • Thermal aging

Fingerprint

Dive into the research topics of 'Effect of a Pd sacrifice layer on the interfacial reaction in Sn-3.5Ag/Pd/Cu'. Together they form a unique fingerprint.

Cite this