Skip to main navigation Skip to search Skip to main content

Direct Assessment of Auger Recombination Rates of Charged Excitons via Opto-Electrical Measurements

  • Hak June Lee
  • , Seunghyun Rhee
  • , Dongju Jung
  • , Jeong Woo Park
  • , Doyoon Shin
  • , Jaemin Lim
  • , Seongbin Im
  • , Jong Ah Chae
  • , Kookheon Char
  • , Kyoungwon Park
  • , Doh C. Lee
  • , Young Shin Park
  • , Wan Ki Bae
  • Sungkyunkwan University
  • Seoul National University
  • Korea Research Institute of Chemical Technology
  • Korea Electronics Technology Institute
  • Korea Advanced Institute of Science and Technology
  • United States Department of Energy

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Direct Assessment of Auger Recombination Rates of Charged Excitons via Opto-Electrical Measurements'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science

Physics