Dielectric studies of vacuum-evaporated CeF 3 thin films

M. Gowtham; D. Y. Kim; D. Mangalaraj; J. Yi

Dielectric studies of vacuum-evaporated CeF ₃ thin films

M. Gowtham
, D. Y. Kim
, D. Mangalaraj
, J. Yi

Department of Electronic and Electrical Engineering

Sungkyunkwan University

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Cerium-fluoride thin films were prepared by using the vacuum thermal evaporation method. Al/CeF ₃/Al (metal-solid electrolyte-metal) sandwich structure was formed on glass substrates, for the study of the AC conduction mechanism. The impedance analysis was performed in the frequency range from 42 Hz to 5 MHz and in the temperature range from 303 to 403 K. The F ^- -ion conduction through the grain and the grain boundary was analyzed. The modulus and the dielectric spectra analyses revealed the non-Debye nature and the distribution of relaxation times in these films.

Original language	English
Pages (from-to)	911-914
Number of pages	4
Journal	Journal of the Korean Physical Society
Volume	44
Issue number	4
State	Published - Apr 2004

Keywords

Dielectric loss
Dielectric relaxation
Ionic conductivity
Modulus spectra
Oxygen sensor

Cite this

@article{ceff64ec1e764fad90f0f7c7f96f760a,

title = "Dielectric studies of vacuum-evaporated CeF 3 thin films",

abstract = "Cerium-fluoride thin films were prepared by using the vacuum thermal evaporation method. Al/CeF 3/Al (metal-solid electrolyte-metal) sandwich structure was formed on glass substrates, for the study of the AC conduction mechanism. The impedance analysis was performed in the frequency range from 42 Hz to 5 MHz and in the temperature range from 303 to 403 K. The F - -ion conduction through the grain and the grain boundary was analyzed. The modulus and the dielectric spectra analyses revealed the non-Debye nature and the distribution of relaxation times in these films.",

keywords = "Dielectric loss, Dielectric relaxation, Ionic conductivity, Modulus spectra, Oxygen sensor",

author = "M. Gowtham and Kim, \{D. Y.\} and D. Mangalaraj and J. Yi",

year = "2004",

month = apr,

language = "English",

volume = "44",

pages = "911--914",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "4",

}

TY - JOUR

T1 - Dielectric studies of vacuum-evaporated CeF 3 thin films

AU - Gowtham, M.

AU - Kim, D. Y.

AU - Mangalaraj, D.

AU - Yi, J.

PY - 2004/4

Y1 - 2004/4

N2 - Cerium-fluoride thin films were prepared by using the vacuum thermal evaporation method. Al/CeF 3/Al (metal-solid electrolyte-metal) sandwich structure was formed on glass substrates, for the study of the AC conduction mechanism. The impedance analysis was performed in the frequency range from 42 Hz to 5 MHz and in the temperature range from 303 to 403 K. The F - -ion conduction through the grain and the grain boundary was analyzed. The modulus and the dielectric spectra analyses revealed the non-Debye nature and the distribution of relaxation times in these films.

AB - Cerium-fluoride thin films were prepared by using the vacuum thermal evaporation method. Al/CeF 3/Al (metal-solid electrolyte-metal) sandwich structure was formed on glass substrates, for the study of the AC conduction mechanism. The impedance analysis was performed in the frequency range from 42 Hz to 5 MHz and in the temperature range from 303 to 403 K. The F - -ion conduction through the grain and the grain boundary was analyzed. The modulus and the dielectric spectra analyses revealed the non-Debye nature and the distribution of relaxation times in these films.

KW - Dielectric loss

KW - Dielectric relaxation

KW - Ionic conductivity

KW - Modulus spectra

KW - Oxygen sensor

UR - https://www.scopus.com/pages/publications/2442610545

M3 - Article

AN - SCOPUS:2442610545

SN - 0374-4884

VL - 44

SP - 911

EP - 914

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 4

ER -

Dielectric studies of vacuum-evaporated CeF ₃ thin films

Abstract

Keywords

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