Device characteristics of organic Light-emitting diodes based on electronic structure of the Ba-Doped Alq 3 layer

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Abstract

Organic light-emitting diodes (OLEDs) with a Ba-doped tris(8-quinolinolato) aluminum(lll) (Alq 3) layer were fabricated to reduce the barrier height for electron injection and to improve the electron conductivity. In the OLED consisting of glass/ITO/4,4′,4″-tris[2-naphthylphenyl-1- phenylamino]triphenyl-amine (2-TNATA, 30 nm)/4,4′-bis[N-(1-napthyl)-N- phenyl-amino]-biphenyl (NPB, 18 nm)/Alq 3 (42 nm)/Ba-doped Alq 3 (20 nm, x% :x = 0, 10, 25, and 50)/AI (100 nm), the device with the Alq 3 layer doped with 10% Ba showed the highest light out-coupling characteristic. However, as the Ba dopant concentration was increased from 25% to 50%, this device characteristic was largely reduced. The characteristics of these devices were interpreted on the basis of the chemical reaction between Ba and Alq 3 and the electron injection property by analyzing the electronic structure of the Ba-doped Alq 3 layer. At a low Ba doping of 10%, mainly the Alq 3 radical anion species was formed. In addition, the barrier height for electron injection in this layer was decreased to 0.6 eV, when compared to the pristine Alq 3 layer. At a high Ba doping of 50%, the Alq 3 molecules were severely decomposed. When the Ba dopant concentration was changed, the light-emitting characteristics of the devices were well coincided with the formation mechanism of Alq 3 radical anion and Alq 3 decomposition species.

Original languageEnglish
Pages (from-to)7485-7490
Number of pages6
JournalJournal of Nanoscience and Nanotechnology
Volume9
Issue number12
DOIs
StatePublished - Dec 2009

Keywords

  • Electronic structure
  • Near-edge x-ray absorption finestructure
  • Organic light-emitting diode
  • Ultraviolet photoemission spectroscopy
  • X-ray photoemission spectroscopy

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