Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy

Soo Young Kim; Jeong Min Baik; Jong Lam Lee

doi:10.1149/1.1996510

Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy

Soo Young Kim, Jeong Min Baik, Jong Lam Lee

Pohang University of Science and Technology

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

4,4′-Bis[N-(1-naphthyl)-N-phenylamino]biphenyl (α-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuO _x-ITC)) and O₂-plasma-treated ITO (O₂-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuO _x-ITO was lower by 0.2 eV than that of O₂-ITO even though RuO_x-ITO had a higher work function. Secondary electron emission spectra after deposition of α-NPD on anodes revealed that the work function of RuO_x-ITO is higher by 0.2 eV than that of O ₂-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier.

Original language	English
Pages (from-to)	H79-H81
Journal	Electrochemical and Solid-State Letters
Volume	8
Issue number	9
DOIs	https://doi.org/10.1149/1.1996510
State	Published - 2005
Externally published	Yes

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title = "Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy",

abstract = "4,4′-Bis[N-(1-naphthyl)-N-phenylamino]biphenyl (α-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuO x-ITC)) and O2-plasma-treated ITO (O2-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuO x-ITO was lower by 0.2 eV than that of O2-ITO even though RuOx-ITO had a higher work function. Secondary electron emission spectra after deposition of α-NPD on anodes revealed that the work function of RuOx-ITO is higher by 0.2 eV than that of O 2-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier.",

author = "Kim, \{Soo Young\} and Baik, \{Jeong Min\} and Lee, \{Jong Lam\}",

year = "2005",

doi = "10.1149/1.1996510",

language = "English",

volume = "8",

pages = "H79--H81",

journal = "Electrochemical and Solid-State Letters",

issn = "1099-0062",

publisher = "Electrochemical Society Inc.",

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}

TY - JOUR

T1 - Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy

AU - Kim, Soo Young

AU - Baik, Jeong Min

AU - Lee, Jong Lam

PY - 2005

Y1 - 2005

N2 - 4,4′-Bis[N-(1-naphthyl)-N-phenylamino]biphenyl (α-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuO x-ITC)) and O2-plasma-treated ITO (O2-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuO x-ITO was lower by 0.2 eV than that of O2-ITO even though RuOx-ITO had a higher work function. Secondary electron emission spectra after deposition of α-NPD on anodes revealed that the work function of RuOx-ITO is higher by 0.2 eV than that of O 2-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier.

AB - 4,4′-Bis[N-(1-naphthyl)-N-phenylamino]biphenyl (α-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuO x-ITC)) and O2-plasma-treated ITO (O2-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuO x-ITO was lower by 0.2 eV than that of O2-ITO even though RuOx-ITO had a higher work function. Secondary electron emission spectra after deposition of α-NPD on anodes revealed that the work function of RuOx-ITO is higher by 0.2 eV than that of O 2-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier.

UR - https://www.scopus.com/pages/publications/25144437010

U2 - 10.1149/1.1996510

DO - 10.1149/1.1996510

M3 - Article

AN - SCOPUS:25144437010

SN - 1099-0062

VL - 8

SP - H79-H81

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

IS - 9

ER -

Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy

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