Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time

Hye Hyun Lee; Kang Yoon Lee

doi:10.1109/ICUFN57995.2023.10200013

Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time

Hye Hyun Lee
, Kang Yoon Lee

Department of Electronic and Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

As memory becomes more versatile, testing to detect defects becomes important. Defect testing occurs at various stages of the device's lifecycle to ensure proper functionality and to verify that it meets the specifications determined by the customer. Having a circuit built into the circuit itself to detect faults can ensure accurate and reliable behavior, and eliminate the need for special equipment for testing, reducing costs and saving time. Accordingly, this paper proposes a circuit that can quickly and accurately detect faults in One-Time Programmable (OTP) Memory. The work has been implemented on a TSMC 55nm CMOS process and the OTP Memory is a 256X32bits One Time Programmable Device used in the TSMC 55nm process from eMemory Technology Inc.

Original language	English
Title of host publication	ICUFN 2023 - 14th International Conference on Ubiquitous and Future Networks
Publisher	IEEE Computer Society
Pages	894-897
Number of pages	4
ISBN (Electronic)	9798350335385
DOIs	https://doi.org/10.1109/ICUFN57995.2023.10200013
State	Published - 2023
Event	14th International Conference on Ubiquitous and Future Networks, ICUFN 2023 - Paris, France Duration: 4 Jul 2023 → 7 Jul 2023

Publication series

Name	International Conference on Ubiquitous and Future Networks, ICUFN
Volume	2023-July
ISSN (Print)	2165-8528
ISSN (Electronic)	2165-8536

Conference

Conference	14th International Conference on Ubiquitous and Future Networks, ICUFN 2023
Country/Territory	France
City	Paris
Period	4/07/23 → 7/07/23

Keywords

Fault Detection Circuit
One-Time Programmable Memories(OTP)
Verilog HDL

Access to Document

10.1109/ICUFN57995.2023.10200013

Cite this

Lee, H. H., & Lee, K. Y. (2023). Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time. In ICUFN 2023 - 14th International Conference on Ubiquitous and Future Networks (pp. 894-897). (International Conference on Ubiquitous and Future Networks, ICUFN; Vol. 2023-July). IEEE Computer Society. https://doi.org/10.1109/ICUFN57995.2023.10200013

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title = "Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time",

abstract = "As memory becomes more versatile, testing to detect defects becomes important. Defect testing occurs at various stages of the device's lifecycle to ensure proper functionality and to verify that it meets the specifications determined by the customer. Having a circuit built into the circuit itself to detect faults can ensure accurate and reliable behavior, and eliminate the need for special equipment for testing, reducing costs and saving time. Accordingly, this paper proposes a circuit that can quickly and accurately detect faults in One-Time Programmable (OTP) Memory. The work has been implemented on a TSMC 55nm CMOS process and the OTP Memory is a 256X32bits One Time Programmable Device used in the TSMC 55nm process from eMemory Technology Inc.",

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year = "2023",

doi = "10.1109/ICUFN57995.2023.10200013",

language = "English",

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Lee, HH & Lee, KY 2023, Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time. in ICUFN 2023 - 14th International Conference on Ubiquitous and Future Networks. International Conference on Ubiquitous and Future Networks, ICUFN, vol. 2023-July, IEEE Computer Society, pp. 894-897, 14th International Conference on Ubiquitous and Future Networks, ICUFN 2023, Paris, France, 4/07/23. https://doi.org/10.1109/ICUFN57995.2023.10200013

Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time. / Lee, Hye Hyun; Lee, Kang Yoon.
ICUFN 2023 - 14th International Conference on Ubiquitous and Future Networks. IEEE Computer Society, 2023. p. 894-897 (International Conference on Ubiquitous and Future Networks, ICUFN; Vol. 2023-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - As memory becomes more versatile, testing to detect defects becomes important. Defect testing occurs at various stages of the device's lifecycle to ensure proper functionality and to verify that it meets the specifications determined by the customer. Having a circuit built into the circuit itself to detect faults can ensure accurate and reliable behavior, and eliminate the need for special equipment for testing, reducing costs and saving time. Accordingly, this paper proposes a circuit that can quickly and accurately detect faults in One-Time Programmable (OTP) Memory. The work has been implemented on a TSMC 55nm CMOS process and the OTP Memory is a 256X32bits One Time Programmable Device used in the TSMC 55nm process from eMemory Technology Inc.

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Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time

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Keywords

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