Depth Order Aware Penalization of False EPI Line Response on Light Field View Synthesis

To overcome the inherent trade-off between the spatial and angular resolutions of light field (LF) images, much research has been carried out on enhancing the angular resolution of an LF image via a view synthesis. Since the height of an Epipolar Plane Image (EPI) corresponds to its angular resolution, LF view synthesis with a higher angular resolution can be performed by stretching its height. Among the existing LF view synthesis research, there is an approach entailing the line detection and line matching processes in EPI domain. However, detecting lines in an EPI of a low angular resolution can come with fake lines, which results in unpleasant artifacts on the synthesized views. To avoid the problem, we present a method of penalizing the response of fake lines in EPI domain based on the possible occlusion cases. Our test results on synthetic and real-world LF datasets show that our method can respectively achieve PSNR and SSIM around 38.67dB / 0.9507 and 40.89dB / 0.9835 on the synthesized views.