Dependence of electrical and optical properties of amorphous SiC:H thin films grown by rf plasma enhanced chemical vapor deposition on annealing temperature
- M. G. Park
- , W. S. Choi
- , B. Hong
- , Y. T. Kim
- , D. H. Yoon
- Sungkyunkwan University
Research output: Contribution to journal › Article › peer-review
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