TY - GEN
T1 - Degradation of oxide cathode properties in vacuum diode configuration
AU - Gärtner, G.
AU - Weon, B. M.
AU - Barratt, D.
N1 - Publisher Copyright:
© 2003 IEEE.
PY - 2003
Y1 - 2003
N2 - Sufficient oxide cathode life of several years in a CRT environment at increased load is one of the key parameters in advanced CRT development. When changes are introduced, accelerated life tests are needed in order to quantify their impact. Hence the investigation of oxide cathode life limiting effects is the basis of accelerated life predictions. Especially three basic effects have been discussed and quantified [I ,3,4] accelerated life by increased operating temperature (compare fig. I) accelerated life by increased continuous load, and finally life acceleration by intermittent or continous poisoning. These mechanisms can also suitably be combined. Besides emission degradation in gun or diode configuration also the secalled cut-off drift plays an essential role for the CRT performance [2]. This drift is related to the necessary adjustment of the voltage settings in the gun over time. An interesting question now is, if there is a relationship between both drifts or maybe a common basis for both, related to more basic degradation mechanisms. A model will be scetched for the diode configuration, where the common link is the change of the I/U emission characteristic with time. From this change both saturated and dc emission degradation and also diode " cut-off drift" can be derived.
AB - Sufficient oxide cathode life of several years in a CRT environment at increased load is one of the key parameters in advanced CRT development. When changes are introduced, accelerated life tests are needed in order to quantify their impact. Hence the investigation of oxide cathode life limiting effects is the basis of accelerated life predictions. Especially three basic effects have been discussed and quantified [I ,3,4] accelerated life by increased operating temperature (compare fig. I) accelerated life by increased continuous load, and finally life acceleration by intermittent or continous poisoning. These mechanisms can also suitably be combined. Besides emission degradation in gun or diode configuration also the secalled cut-off drift plays an essential role for the CRT performance [2]. This drift is related to the necessary adjustment of the voltage settings in the gun over time. An interesting question now is, if there is a relationship between both drifts or maybe a common basis for both, related to more basic degradation mechanisms. A model will be scetched for the diode configuration, where the common link is the change of the I/U emission characteristic with time. From this change both saturated and dc emission degradation and also diode " cut-off drift" can be derived.
UR - https://www.scopus.com/pages/publications/84947805872
U2 - 10.1109/IVEC.2003.1286333
DO - 10.1109/IVEC.2003.1286333
M3 - Conference contribution
AN - SCOPUS:84947805872
T3 - 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings
SP - 309
EP - 310
BT - 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th IEEE International Vacuum Electronics Conference, IVEC 2003
Y2 - 28 May 2003 through 30 May 2003
ER -