Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process

Zin Min Park; Duk Young Jeon; Seung Nam Cha; Yong Wan Jin; Jong Min Kim

Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process

Zin Min Park
, Duk Young Jeon
, Seung Nam Cha
, Yong Wan Jin
, Jong Min Kim

Research output: Contribution to conference › Paper › peer-review

Abstract

Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen.

Original language	English
Pages	197-198
Number of pages	2
State	Published - 2001
Externally published	Yes
Event	Proceedings of the 14th International Vacuum Microelectronics Conference - Davis, CA, United States Duration: 12 Aug 2001 → 16 Aug 2001

Conference

Conference	Proceedings of the 14th International Vacuum Microelectronics Conference
Country/Territory	United States
City	Davis, CA
Period	12/08/01 → 16/08/01

Cite this

@conference{98679fe3b92d47f999ef64b54603d6f8,

title = "Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process",

abstract = "Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen.",

author = "Park, \{Zin Min\} and Jeon, \{Duk Young\} and Cha, \{Seung Nam\} and Jin, \{Yong Wan\} and Kim, \{Jong Min\}",

year = "2001",

language = "English",

pages = "197--198",

note = "Proceedings of the 14th International Vacuum Microelectronics Conference ; Conference date: 12-08-2001 Through 16-08-2001",

}

Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process. / Park, Zin Min; Jeon, Duk Young; Cha, Seung Nam et al.
2001. 197-198 Paper presented at Proceedings of the 14th International Vacuum Microelectronics Conference, Davis, CA, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process

AU - Park, Zin Min

AU - Jeon, Duk Young

AU - Cha, Seung Nam

AU - Jin, Yong Wan

AU - Kim, Jong Min

PY - 2001

Y1 - 2001

N2 - Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen.

AB - Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen.

UR - https://www.scopus.com/pages/publications/0035784653

M3 - Paper

AN - SCOPUS:0035784653

SP - 197

EP - 198

T2 - Proceedings of the 14th International Vacuum Microelectronics Conference

Y2 - 12 August 2001 through 16 August 2001

ER -

Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process

Abstract

Conference

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