Deembedding accuracy for device scale and interconnection line parasitics

Jaeho Lee; Jaehong Lee; Jongwook Jeon; Hee Sauk Jhon; Hyungcheol Shin

doi:10.1109/LMWC.2009.2032011

Deembedding accuracy for device scale and interconnection line parasitics

Jaeho Lee
, Jaehong Lee
, Jongwook Jeon
, Hee Sauk Jhon
, Hyungcheol Shin

Seoul National University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

In this letter, we investigate the deembedding accuracy of OPEN-SHORT (OS) and PAD-OPEN-SHORT (POS) deembedding for transistor measurement and modeling. It is found that all of the transistor intrinsic element values except for the gate-resistance, R_gare independent of the deembedding procedure. Furthermore, the difference in R_g is dependent on the device size. To analyze the origin of the deembedding difference, the equivalent circuits of the PADs and interconnection lines are constructed from the measured data by varying the values of parasitic parameters.

Original language	English
Article number	5290042
Pages (from-to)	713-715
Number of pages	3
Journal	IEEE Microwave and Wireless Components Letters
Volume	19
Issue number	11
DOIs	https://doi.org/10.1109/LMWC.2009.2032011
State	Published - Nov 2009
Externally published	Yes

Keywords

Deembedding technique
Interconnection-line parasitics
Open-short (OS)
Pad-open-short (POS)
R
RF CMOS

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10.1109/LMWC.2009.2032011

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title = "Deembedding accuracy for device scale and interconnection line parasitics",

abstract = "In this letter, we investigate the deembedding accuracy of OPEN-SHORT (OS) and PAD-OPEN-SHORT (POS) deembedding for transistor measurement and modeling. It is found that all of the transistor intrinsic element values except for the gate-resistance, Rgare independent of the deembedding procedure. Furthermore, the difference in Rg is dependent on the device size. To analyze the origin of the deembedding difference, the equivalent circuits of the PADs and interconnection lines are constructed from the measured data by varying the values of parasitic parameters.",

keywords = "Deembedding technique, Interconnection-line parasitics, Open-short (OS), Pad-open-short (POS), R, RF CMOS",

author = "Jaeho Lee and Jaehong Lee and Jongwook Jeon and Jhon, \{Hee Sauk\} and Hyungcheol Shin",

year = "2009",

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pages = "713--715",

journal = "IEEE Microwave and Wireless Components Letters",

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T1 - Deembedding accuracy for device scale and interconnection line parasitics

AU - Lee, Jaeho

AU - Lee, Jaehong

AU - Jeon, Jongwook

AU - Jhon, Hee Sauk

AU - Shin, Hyungcheol

PY - 2009/11

Y1 - 2009/11

N2 - In this letter, we investigate the deembedding accuracy of OPEN-SHORT (OS) and PAD-OPEN-SHORT (POS) deembedding for transistor measurement and modeling. It is found that all of the transistor intrinsic element values except for the gate-resistance, Rgare independent of the deembedding procedure. Furthermore, the difference in Rg is dependent on the device size. To analyze the origin of the deembedding difference, the equivalent circuits of the PADs and interconnection lines are constructed from the measured data by varying the values of parasitic parameters.

AB - In this letter, we investigate the deembedding accuracy of OPEN-SHORT (OS) and PAD-OPEN-SHORT (POS) deembedding for transistor measurement and modeling. It is found that all of the transistor intrinsic element values except for the gate-resistance, Rgare independent of the deembedding procedure. Furthermore, the difference in Rg is dependent on the device size. To analyze the origin of the deembedding difference, the equivalent circuits of the PADs and interconnection lines are constructed from the measured data by varying the values of parasitic parameters.

KW - Deembedding technique

KW - Interconnection-line parasitics

KW - Open-short (OS)

KW - Pad-open-short (POS)

KW - R

KW - RF CMOS

UR - https://www.scopus.com/pages/publications/70449532046

U2 - 10.1109/LMWC.2009.2032011

DO - 10.1109/LMWC.2009.2032011

M3 - Article

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SN - 1531-1309

VL - 19

SP - 713

EP - 715

JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

IS - 11

M1 - 5290042

ER -

Deembedding accuracy for device scale and interconnection line parasitics

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Keywords

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