DAT: Leveraging Device-Specific Noise for Efficient and Robust AI Training in ReRAM-based Systems

Chanwoo Park, Jongwook Jeon, Hyunbo Cho

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The increasing interest in artificial intelligence (AI) and the limitations of general-purpose graphics processing units (GPUs) have prompted the exploration of neuromorphic devices, such as resistive random-access memory (ReRAM), for AI computation. However, ReRAM devices exhibit various sources of variability that impact their performance and reliability. In this paper, we propose Device-Aware Training (DAT), a robust training method that accounts for device-specific noise and resilience against inherent variability in ReRAM devices. To address the significant computational costs of noise-robust training, DAT employs sharpness-aware minimization and a low-rank approximation of the device-specific noise covariance matrix. This leads to efficient computation and reduced training time while maintaining versatility across various model architectures and tasks. We evaluate our method on CIFAR-10 and CIFAR-100 datasets, achieving a 38.2% increase in test accuracy in the presence of analog noise and a 5.9x faster training time compared to using a full-rank covariance matrix. From a loss landscape perspective, we provide insights into addressing noise-induced challenges in the weight space. DAT contributes to the development of reliable and high-performing neuromorphic AI systems based on ReRAM technology.

Original languageEnglish
Title of host publication2023 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages289-292
Number of pages4
ISBN (Electronic)9784863488038
DOIs
StatePublished - 2023
Event2023 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2023 - Kobe, Japan
Duration: 27 Sep 202329 Sep 2023

Publication series

NameInternational Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Conference

Conference2023 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2023
Country/TerritoryJapan
CityKobe
Period27/09/2329/09/23

Keywords

  • Neuromorphic AI systems
  • Resistive random-access memory (ReRAM)
  • Robust training

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