Abstract
Four types of thin film coating were carried out on copper for electronic materials by the electroless plating method at a pH range from 3 to 9. The coating performance was evaluated by electrochemical impedance spectroscopy and potentiodynamic polarization testing in a 3.5 wt.% NaCl solution. In addition, atomic force microscopy and X-ray diffraction were also used to analyze the coating surfaces. The electrochemical behavior of the coatings was improved using the electroless nickel plating solution of pH 5. The electroless nickel/immersion gold on the copper substrate exhibited high protective efficiency, charge transfer resistance and very low porosity, indicating an increase in corrosion resistance. Atomic force microscopy and X-ray diffraction analyses confirmed the surface uniformity and the formation of the crystalline-refined NiP {1 2 2} phase at pH 5.
| Original language | English |
|---|---|
| Pages (from-to) | 305-308 |
| Number of pages | 4 |
| Journal | Materials Research Bulletin |
| Volume | 45 |
| Issue number | 3 |
| DOIs | |
| State | Published - Mar 2010 |
Keywords
- A. Electronic materials
- C. Atomic force microscopy
- C. Impedance spectroscopy
- C. X-ray diffraction
- D. Surface properties