Corrigendum to "An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects" [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004)

Jongwook Jeon; Jong Duk Lee; Byung Gook Park; Hyungcheol Shin

doi:10.1016/j.sse.2008.08.004

Corrigendum to "An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects" [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004)

Jongwook Jeon
, Jong Duk Lee
, Byung Gook Park
, Hyungcheol Shin

Seoul National University

Research output: Contribution to journal › Comment/debate

1 Scopus citations

Original language	English
Pages (from-to)	1837
Number of pages	1
Journal	Solid-State Electronics
Volume	52
Issue number	11
DOIs	https://doi.org/10.1016/j.sse.2008.08.004
State	Published - Nov 2008
Externally published	Yes

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10.1016/j.sse.2008.08.004

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@article{812236fb33c747c8b4a312c9d75b795a,

title = "Corrigendum to {"}An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects{"} [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004)",

author = "Jongwook Jeon and Lee, \{Jong Duk\} and Park, \{Byung Gook\} and Hyungcheol Shin",

year = "2008",

month = nov,

doi = "10.1016/j.sse.2008.08.004",

language = "English",

volume = "52",

pages = "1837",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier Ltd",

number = "11",

}

Corrigendum to "An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects" [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004). / Jeon, Jongwook; Lee, Jong Duk; Park, Byung Gook et al.
In: Solid-State Electronics, Vol. 52, No. 11, 11.2008, p. 1837.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Corrigendum to "An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects" [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004)

AU - Jeon, Jongwook

AU - Lee, Jong Duk

AU - Park, Byung Gook

AU - Shin, Hyungcheol

PY - 2008/11

Y1 - 2008/11

UR - https://www.scopus.com/pages/publications/55049103837

U2 - 10.1016/j.sse.2008.08.004

DO - 10.1016/j.sse.2008.08.004

M3 - Comment/debate

AN - SCOPUS:55049103837

SN - 0038-1101

VL - 52

SP - 1837

JO - Solid-State Electronics

JF - Solid-State Electronics

IS - 11

ER -

Corrigendum to "An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects" [Solid State Electronics 51(7) (2007) 1034-1038] (DOI:10.1016/j.sse.2007.05.004)

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