Corrigendum: Low Voltage Transmission Electron Microscopy of Graphene (Small (2015) 11 (515-542) DOI: 10.1002/smll.201401804)

Alicja Bachmatiuk; Jiong Zhao; Sandeep Madhukar Gorantla; Ignacio Guillermo Gonzalez Martinez; Jerzy Wiedermann; Changgu Lee; Juergen Eckert; Mark Hermann Rummeli

doi:10.1002/smll.201503609

Corrigendum: Low Voltage Transmission Electron Microscopy of Graphene (Small (2015) 11 (515-542) DOI: 10.1002/smll.201401804)

Alicja Bachmatiuk
, Jiong Zhao
, Sandeep Madhukar Gorantla
, Ignacio Guillermo Gonzalez Martinez
, Jerzy Wiedermann
, Changgu Lee
, Juergen Eckert
, Mark Hermann Rummeli

Department of Mechanical Engineering

Research output: Contribution to journal › Comment/debate

3 Scopus citations

Original language	English
Pages (from-to)	1251
Number of pages	1
Journal	Small
Volume	12
Issue number	10
DOIs	https://doi.org/10.1002/smll.201503609
State	Published - 9 Mar 2016

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10.1002/smll.201503609

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title = "Corrigendum: Low Voltage Transmission Electron Microscopy of Graphene (Small (2015) 11 (515-542) DOI: 10.1002/smll.201401804)",

author = "Alicja Bachmatiuk and Jiong Zhao and Gorantla, \{Sandeep Madhukar\} and Martinez, \{Ignacio Guillermo Gonzalez\} and Jerzy Wiedermann and Changgu Lee and Juergen Eckert and Rummeli, \{Mark Hermann\}",

year = "2016",

month = mar,

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doi = "10.1002/smll.201503609",

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T1 - Corrigendum

T2 - Low Voltage Transmission Electron Microscopy of Graphene (Small (2015) 11 (515-542) DOI: 10.1002/smll.201401804)

AU - Bachmatiuk, Alicja

AU - Zhao, Jiong

AU - Gorantla, Sandeep Madhukar

AU - Martinez, Ignacio Guillermo Gonzalez

AU - Wiedermann, Jerzy

AU - Lee, Changgu

AU - Eckert, Juergen

AU - Rummeli, Mark Hermann

PY - 2016/3/9

Y1 - 2016/3/9

UR - https://www.scopus.com/pages/publications/84960078465

U2 - 10.1002/smll.201503609

DO - 10.1002/smll.201503609

M3 - Comment/debate

AN - SCOPUS:84960078465

SN - 1613-6810

VL - 12

SP - 1251

JO - Small

JF - Small

IS - 10

ER -

Corrigendum: Low Voltage Transmission Electron Microscopy of Graphene (Small (2015) 11 (515-542) DOI: 10.1002/smll.201401804)

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