Contact resistance between metal and carbon nanotube interconnects: Effect of work function and wettability

Seong Chu Lim, Jin Ho Jang, Dong Jae Bae, Gang Hee Han, Sunwoo Lee, In Seok Yeo, Young Hee Lee

Research output: Contribution to journalArticlepeer-review

204 Scopus citations

Abstract

The contact resistance of 14 different electrode metals with the work function between 3.9 and 5.7 eV has been investigated for carbon nanotube (CNT) interconnects. We observed that the contact resistance was mainly influenced by the two following parameters: the wettability and the work function difference of electrode metal to CNT. Ti, Cr, and Fe with good wettability showed lower resistance than other metals. Furthermore, no dependence of the contact resistance on the work function difference has been observed. However, the contact resistance of Au, Pd, and Pt with poor wettability increased as the work function difference became larger.

Original languageEnglish
Article number264103
JournalApplied Physics Letters
Volume95
Issue number26
DOIs
StatePublished - 2009
Externally publishedYes

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