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Comparison of top-gate and bottom-gate amorphous InGaZnO thin-film transistors with the same SiO2/a-InGaZnO/SiO2 stack

  • Saeroonter Oh
  • , Ju Heyuck Baeck
  • , Hyun Soo Shin
  • , Jong Uk Bae
  • , Kwon Shik Park
  • , In Byeong Kang

Research output: Contribution to journal › Article › peer-review

33   Link opens in a new tab Scopus citations

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