TY - GEN
T1 - Coded Pattern Optimization
T2 - 2022 International Conference on Electronics, Information, and Communication, ICEIC 2022
AU - Lee, Jaelin
AU - Jeon, Byeungwoo
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Coded exposure photography (CEP) modulates a point spread function (PSF) causing motion blur to enhance the motion deblurring performance. The performance of motion deblurring using CEP depends on the coded pattern which modulates the PSF, thus, the optimality of the coded pattern is the key to successful deblurring. Since the intensity of the captured image has a non-linear relation with the irradiance of the scene, the CEP without considering the non-linear relationship in deblurring is very likely to have poor deblurring results. In this paper, we investigate how to optimize the pattern by considering the nonlinear characteristics of image capturing.
AB - Coded exposure photography (CEP) modulates a point spread function (PSF) causing motion blur to enhance the motion deblurring performance. The performance of motion deblurring using CEP depends on the coded pattern which modulates the PSF, thus, the optimality of the coded pattern is the key to successful deblurring. Since the intensity of the captured image has a non-linear relation with the irradiance of the scene, the CEP without considering the non-linear relationship in deblurring is very likely to have poor deblurring results. In this paper, we investigate how to optimize the pattern by considering the nonlinear characteristics of image capturing.
KW - coded exposure photography
KW - coded pattern
KW - computational photography
KW - motion deblurring
UR - https://www.scopus.com/pages/publications/85128831883
U2 - 10.1109/ICEIC54506.2022.9748694
DO - 10.1109/ICEIC54506.2022.9748694
M3 - Conference contribution
AN - SCOPUS:85128831883
T3 - 2022 International Conference on Electronics, Information, and Communication, ICEIC 2022
BT - 2022 International Conference on Electronics, Information, and Communication, ICEIC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 6 February 2022 through 9 February 2022
ER -