Chlorine radical doping of a few layer graphene with low damage

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Abstract

We present a graphene plasma doping method using chlorine radicals generated in an inductively coupled plasma (ICP) with a double mesh grid system. Raman spectroscopy and sheet resistance measurement showed that this doping method is non-destructive and controllable approach for the p-type graphene layer doping method. And, by using a chlorine trap-doping method, the sheet resistance could be decreased to 76% at an optimized condition for the tri-layer graphene.

Original languageEnglish
Pages (from-to)N5095-N5097
JournalECS Journal of Solid State Science and Technology
Volume4
Issue number6
DOIs
StatePublished - 2015

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