Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy

Hyunwook Song; Hyoyoung Lee; Takhee Lee

doi:10.1016/j.ultramic.2008.04.016

Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy

Hyunwook Song, Hyoyoung Lee, Takhee Lee

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We report on a tip-loading force-dependent tunneling behavior through alkanethiol self-assembled monolayers formed in metal-molecule-metal junctions, using conducting atomic force microscopy. The metal-molecule contacts were formed by placing a conductive tip in a stationary point contact on alkanethiol self-assembled monolayers under a controlled tip-loading force. Current-voltage characteristics in the alkanethiol junctions are simultaneously measured, while varying the loading forces. Tunneling current through the alkanethiol junctions increases and decay coefficient β_N decreases, respectively, with increasing tip-loading force, which results from enhanced intermolecular charge transfer in a tilted molecular configuration under the tip-loading effect.

Original language	English
Pages (from-to)	1196-1199
Number of pages	4
Journal	Ultramicroscopy
Volume	108
Issue number	10
DOIs	https://doi.org/10.1016/j.ultramic.2008.04.016
State	Published - Sep 2008
Externally published	Yes

Keywords

Conducting atomic force microscopy
Molecular electronics
Self-assembled monolayers
Tunneling

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10.1016/j.ultramic.2008.04.016

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title = "Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy",

abstract = "We report on a tip-loading force-dependent tunneling behavior through alkanethiol self-assembled monolayers formed in metal-molecule-metal junctions, using conducting atomic force microscopy. The metal-molecule contacts were formed by placing a conductive tip in a stationary point contact on alkanethiol self-assembled monolayers under a controlled tip-loading force. Current-voltage characteristics in the alkanethiol junctions are simultaneously measured, while varying the loading forces. Tunneling current through the alkanethiol junctions increases and decay coefficient βN decreases, respectively, with increasing tip-loading force, which results from enhanced intermolecular charge transfer in a tilted molecular configuration under the tip-loading effect.",

keywords = "Conducting atomic force microscopy, Molecular electronics, Self-assembled monolayers, Tunneling",

author = "Hyunwook Song and Hyoyoung Lee and Takhee Lee",

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doi = "10.1016/j.ultramic.2008.04.016",

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AU - Lee, Hyoyoung

AU - Lee, Takhee

PY - 2008/9

Y1 - 2008/9

N2 - We report on a tip-loading force-dependent tunneling behavior through alkanethiol self-assembled monolayers formed in metal-molecule-metal junctions, using conducting atomic force microscopy. The metal-molecule contacts were formed by placing a conductive tip in a stationary point contact on alkanethiol self-assembled monolayers under a controlled tip-loading force. Current-voltage characteristics in the alkanethiol junctions are simultaneously measured, while varying the loading forces. Tunneling current through the alkanethiol junctions increases and decay coefficient βN decreases, respectively, with increasing tip-loading force, which results from enhanced intermolecular charge transfer in a tilted molecular configuration under the tip-loading effect.

AB - We report on a tip-loading force-dependent tunneling behavior through alkanethiol self-assembled monolayers formed in metal-molecule-metal junctions, using conducting atomic force microscopy. The metal-molecule contacts were formed by placing a conductive tip in a stationary point contact on alkanethiol self-assembled monolayers under a controlled tip-loading force. Current-voltage characteristics in the alkanethiol junctions are simultaneously measured, while varying the loading forces. Tunneling current through the alkanethiol junctions increases and decay coefficient βN decreases, respectively, with increasing tip-loading force, which results from enhanced intermolecular charge transfer in a tilted molecular configuration under the tip-loading effect.

KW - Conducting atomic force microscopy

KW - Molecular electronics

KW - Self-assembled monolayers

KW - Tunneling

UR - https://www.scopus.com/pages/publications/49949084046

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DO - 10.1016/j.ultramic.2008.04.016

M3 - Article

AN - SCOPUS:49949084046

SN - 0304-3991

VL - 108

SP - 1196

EP - 1199

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 10

ER -

Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy

Abstract

Keywords

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