Abstract
The chemical composition and electrical properties were investigated for epitaxially crystallized (Ba05,Sr05)TiO3 films deposited on Pt/MgO and YBaz2Cu3O7-x(YBCO)/MgO substrates by the laser ablation technique. Rutherford backscattering spectroscopy (RBS) analysis shows that thin films on Pt/MgO have almost the same stoichiometric composition as the target material. Films deposited on Pt/MgO at 600t: exhibited a dielectric constant of 330 and a dissipation factor of 0.02 at 100 kHz frequency. Leakage current density of BST thin films on Pt/MgO was smaller than on YBCO/MgO. Their leakage current density is about 0.8 μ A/cm2 at an applied electric field of 0.15 MY/cm.
| Original language | English |
|---|---|
| Pages (from-to) | 329-339 |
| Number of pages | 11 |
| Journal | Integrated Ferroelectrics |
| Volume | 7 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Feb 1995 |
| Externally published | Yes |