@inproceedings{d22a498ebc63455e88ab2f14577d3b91,
title = "Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs",
abstract = "This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.",
author = "Kwak, \{Sang Keun\} and Jo, \{Jeong Min\} and Noh, \{Seok Soon\} and Lee, \{Hye Sook\} and Wansoo Nah and Kim, \{So Young\}",
year = "2012",
doi = "10.1109/APEMC.2012.6237908",
language = "English",
isbn = "9781457715587",
series = "cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings",
pages = "565--568",
booktitle = "2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings",
note = "2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 ; Conference date: 21-05-2012 Through 24-05-2012",
}