TY - JOUR
T1 - Bi-polysilicon passivating contact technique for crystalline silicon solar cell
AU - Kim, Sungheon
AU - Jeong, Sungjin
AU - Kim, Hongrae
AU - Khokhar, Muhammad Quddamah
AU - Dhungel, Suresh Kumar
AU - Dao, Vinh Ai
AU - Pham, Duy Phong
AU - Kim, Youngkuk
AU - Yi, Junsin
N1 - Publisher Copyright:
© 2023 Elsevier Ltd
PY - 2023/6/15
Y1 - 2023/6/15
N2 - Polysilicon (poly-Si) passivating contacts overcome the direct metal–semiconductor contact drawback of traditional industrial crystalline silicon (c-Si) solar cells by inserting a layer stack of poly-Si and silicon oxide layers at the rear full-area metal/c-Si interface, which is well-known as a tunnel oxide passivating contact (TOPCon). In conventional industrial TOPCon devices, the direct contact problem affects the emitter, which deteriorates the passivation quality and suppresses the open-circuit voltage (Voc). We herein introduce an innovative bi-poly-Si technique (Bi-TOPCon) featuring rear full-area passivated poly-Si and emitter locally passivated poly-Si to improve the passivation quality of the TOPCon device. The local emitter poly-Si is introduced using metal mask alignment, and its properties are optimised toward high passivation quality and low contact resistance. The Bi-TOPCon device shows a significant improvement in Voc (Voc > 700 mV). Bi-TOPCon is a promising technology for high-efficiency, next-generation industrial TOPCon devices.
AB - Polysilicon (poly-Si) passivating contacts overcome the direct metal–semiconductor contact drawback of traditional industrial crystalline silicon (c-Si) solar cells by inserting a layer stack of poly-Si and silicon oxide layers at the rear full-area metal/c-Si interface, which is well-known as a tunnel oxide passivating contact (TOPCon). In conventional industrial TOPCon devices, the direct contact problem affects the emitter, which deteriorates the passivation quality and suppresses the open-circuit voltage (Voc). We herein introduce an innovative bi-poly-Si technique (Bi-TOPCon) featuring rear full-area passivated poly-Si and emitter locally passivated poly-Si to improve the passivation quality of the TOPCon device. The local emitter poly-Si is introduced using metal mask alignment, and its properties are optimised toward high passivation quality and low contact resistance. The Bi-TOPCon device shows a significant improvement in Voc (Voc > 700 mV). Bi-TOPCon is a promising technology for high-efficiency, next-generation industrial TOPCon devices.
KW - Carrier selective contact
KW - Crystalline silicon solar cells
KW - Polysilicon materials
KW - Tunnelling oxide passivating contact
UR - https://www.scopus.com/pages/publications/85150014869
U2 - 10.1016/j.mssp.2023.107453
DO - 10.1016/j.mssp.2023.107453
M3 - Article
AN - SCOPUS:85150014869
SN - 1369-8001
VL - 160
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
M1 - 107453
ER -