Autonomous AI-Driven Measurement and Characterization of 2D Materials Using Scanning Probe Microscopy
- Jaeuk Sung
- , Seungjae Heo
- , Dohyun Kim
- , Youngmee Kwon
- , Jinyoung You
- , Yanggeun Joo
- , Eunji Hwang
- , Jungyu Lee
- , Sang Joon Cho
- , Heejun Yang
- , Yunseok Kim
Research output: Contribution to journal › Article › peer-review