Automatic calibration of Time to Digital Converter

  • Young Ho Lee
  • , Kwang Hee Lee
  • , Jong Wan Seo
  • , Dong Hwan Lim
  • , Sang Hwa Lee
  • , Jin Myoung Kim
  • , Tae Yong Kuc
  • , Seung Min Baek
  • , Ki Min Lee
  • , S. J. Jung
  • , Seung Ho Baeg
  • , M. H. Baeg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Due to its restricted usage and accuracy in measuring extremely short interval of time, TDC (Time to Digital Converter) embedded measurement devices are relatively expansive. Even if new applications are being developed in daily life as well as in industry, the cost condition of TDC based measurement systems needs to be improved. To reduce the deployment cost on a commercial scale, analogue interpolation method is preferred to digital interpolation method for most of TDCs. However, the analogue interpolation method does not provide robustness to temperature variation and non-uniformity of parts, which results in difficulty in maintaining the expected repeatability. In this paper, an auto-calibration method is proposed for robust operation and precise measurement of TDC under the condition of temperature variation and lack of parts uniformity.

Original languageEnglish
Title of host publication2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
PublisherIEEE Computer Society
Pages1012-1017
Number of pages6
ISBN (Print)9781424433537
DOIs
StatePublished - 2009
Event2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009 - Singapore, Singapore
Duration: 5 May 20097 May 2009

Publication series

Name2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009

Conference

Conference2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
Country/TerritorySingapore
CitySingapore
Period5/05/097/05/09

Keywords

  • Automatic calibration, temperature compensation
  • Passive component
  • Time to Digital Converter

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