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Atomic layer engineering of perovskite oxides for chemically sharp heterointerfaces

  • Woo Seok Choi
  • , Christopher M. Rouleau
  • , Sung Seok A. Seo
  • , Zhenlin Luo
  • , Hua Zhou
  • , Timothy T. Fister
  • , Jeffrey A. Eastman
  • , Paul H. Fuoss
  • , Dillon D. Fong
  • , Jonathan Z. Tischler
  • , Gyula Eres
  • , Matthew F. Chisholm
  • , Ho Nyung Lee
  • Oak Ridge National Laboratory
  • University of Kentucky
  • Argonne National Laboratory
  • University of Science and Technology of China
  • United States Department of Energy

Research output: Contribution to journal › Article › peer-review

Abstract

Atomic layer engineering enables fabrication of a chemically sharp oxide heterointerface. The interface formation and strain evolution during the initial growth of LaAlO3/SrTiO3 heterostructures by pulsed laser deposition are investigated in search of a means for controlling the atomic-sharpness of the interface. This study shows that inserting a monolayer of LaAlO3 grown at high oxygen pressure dramatically enhances interface abruptness.

Original languageEnglish
Pages (from-to)6423-6428
Number of pages6
JournalAdvanced Materials
Volume24
Issue number48
DOIs
StatePublished - 18 Dec 2012
Externally publishedYes

Keywords

  • atomic layer engineering
  • epitaxial strain
  • LaAlO /SrTiO
  • perovskite oxide interface
  • pulsed laser deposition

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