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Assessment of silicon MOS and carbon nanotube FET performance limits using a general theory of ballistic transistors

  • Jing Guo
  • , Supriyo Datta
  • , Mark Lundstrom
  • , Markus Brink
  • , Paul McEuen
  • , Ali Javey
  • , Hongjie Dai
  • , Hyoungsub Kim
  • , Paul McIntyre

Research output: Contribution to journalConference articlepeer-review

Abstract

A simple model for ballistic nanotransistors, which extends previous work by treating both the charge control and the quantum capacitance limits of MOSFET-like transistors, is presented. We apply this new model to MOSFET-like carbon nanotube FETs (CNTFETs) and to MOSFETs at the scaling limit. The device physics for operation at ballistic and quantum capacitance limits will be explored. Based on the analysis of recently reported CNTFETs, we compare CNTFETs to MOSFETs. The potential performance advantages over Si that might be achieved at the scaling limit are established by using the new model.

Original languageEnglish
Pages (from-to)711-714
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting
StatePublished - 2002
Externally publishedYes
Event2002 IEEE International Devices Meeting (IEDM) - San Francisco, CA, United States
Duration: 8 Dec 200211 Dec 2002

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