TY - JOUR
T1 - Artificially controlled two-step electrodeposition of Cu and Cu/In metal precursors with improved surface roughness for solar applications
AU - Kwon, Yong Hun
AU - Kim, Sung Kyun
AU - Kim, Sang Woo
AU - Cho, Hyung Koun
PY - 2014
Y1 - 2014
N2 - The very smooth surfaces of the multistacked metal layers fabricated by electrodeposition are particularly useful for obtaining the designed composition and the optimized composition distribution in CIGS solar cells. Thus, we employed an artificially controlled two-step electrodeposition method for the deposition of reproducible and smooth Cu layers on Mo substrates. First, the chronoamperometry at various applied potentials was investigated to confirm growth behavior at a direct constant potential. According to these results, a two-step process was designed: i) at the first step, high negative potential was applied for the formation of high density nuclei, and ii) at the second step, low negative potential was employed to promote the homogenous coalescence of the Cu nuclei. As a result, the root mean square (RMS) value of the Cu surface measured by atomic force microscopy was considerably decreased by up to 6.0 nm using the two-step process, compared to that fabricated using a single-step process. In addition, the relatively smooth In surface was observed on the Cu/In bilayers fabricated using the two-step process.
AB - The very smooth surfaces of the multistacked metal layers fabricated by electrodeposition are particularly useful for obtaining the designed composition and the optimized composition distribution in CIGS solar cells. Thus, we employed an artificially controlled two-step electrodeposition method for the deposition of reproducible and smooth Cu layers on Mo substrates. First, the chronoamperometry at various applied potentials was investigated to confirm growth behavior at a direct constant potential. According to these results, a two-step process was designed: i) at the first step, high negative potential was applied for the formation of high density nuclei, and ii) at the second step, low negative potential was employed to promote the homogenous coalescence of the Cu nuclei. As a result, the root mean square (RMS) value of the Cu surface measured by atomic force microscopy was considerably decreased by up to 6.0 nm using the two-step process, compared to that fabricated using a single-step process. In addition, the relatively smooth In surface was observed on the Cu/In bilayers fabricated using the two-step process.
UR - https://www.scopus.com/pages/publications/84904907570
U2 - 10.1149/2.0771409jes
DO - 10.1149/2.0771409jes
M3 - Article
AN - SCOPUS:84904907570
SN - 0013-4651
VL - 161
SP - D447-D452
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 9
ER -