Approaches to Improve Mobility and Stability of IGZO TFTs: A Brief Review

  • Zhong Pan
  • , Yifan Hu
  • , Jingwen Chen
  • , Fucheng Wang
  • , Yeojin Jeong
  • , Duy Phong Pham
  • , Junsin Yi

Research output: Contribution to journalReview articlepeer-review

Abstract

Among metal oxide material TFTs, IGZO TFTs are highly regarded for their exceptionally high mobility, exceeding 10 cm²/V·s, remarkable transparency of more than 80%, and their adaptable low-temperature fabrication techniques. High-performance displays operating at refresh rates of up to 144 Hz and undergoing millions of device switches demand IGZO TFTs with mobility exceeding 20 cm²/V·s and higher stability against impulse stress. The effect of IGZO material composition on device stability and recent strategies to promote the mobility and stability of IGZO TFT by modifying the transistor structure, preparation process, and post-processing techniques to reduce VO have been discussed. The paper describes the application of IGZO TFTs in flexible electronics. Graphical Abstract: (Figure presented.)

Original languageEnglish
Pages (from-to)371-379
Number of pages9
JournalTransactions on Electrical and Electronic Materials
Volume25
Issue number4
DOIs
StatePublished - Aug 2024

Keywords

  • Annealing
  • IGZO
  • Oxygen vacancy
  • Passivation layer
  • Process
  • Thin film transistor

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