TY - GEN
T1 - Analyzing deep neural networks with noisy labels
AU - Lim, Chan
AU - Han, Sangwoo
AU - Lee, Jongwuk
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/2
Y1 - 2020/2
N2 - Training deep neural networks (DNNs) with noisy labels is a fundamental problem in achieving generalization in DNNs. Recent studies mainly adopt sample selection in which the samples with small losses are regarded as clean ones, based on the findings that DNNs tend to learn simple and easy patterns first, and then gradually memorize all data. In this paper, we further investigate the sample selection by observing the loss distribution of training samples with clean and noisy labels. In experimental results, we found that the loss distributions with clean and noisy samples are different at the early stage, and gradually converge into similar distributions. Besides, this phenomenon is notably different depending on the datasets and noise types, such as symmetric and pair. Based on these findings, we argue that the sample selection method should consider an early stopping condition in learning DNNs with noisy labels.
AB - Training deep neural networks (DNNs) with noisy labels is a fundamental problem in achieving generalization in DNNs. Recent studies mainly adopt sample selection in which the samples with small losses are regarded as clean ones, based on the findings that DNNs tend to learn simple and easy patterns first, and then gradually memorize all data. In this paper, we further investigate the sample selection by observing the loss distribution of training samples with clean and noisy labels. In experimental results, we found that the loss distributions with clean and noisy samples are different at the early stage, and gradually converge into similar distributions. Besides, this phenomenon is notably different depending on the datasets and noise types, such as symmetric and pair. Based on these findings, we argue that the sample selection method should consider an early stopping condition in learning DNNs with noisy labels.
UR - https://www.scopus.com/pages/publications/85084365675
U2 - 10.1109/BigComp48618.2020.00012
DO - 10.1109/BigComp48618.2020.00012
M3 - Conference contribution
AN - SCOPUS:85084365675
T3 - Proceedings - 2020 IEEE International Conference on Big Data and Smart Computing, BigComp 2020
SP - 571
EP - 574
BT - Proceedings - 2020 IEEE International Conference on Big Data and Smart Computing, BigComp 2020
A2 - Lee, Wookey
A2 - Chen, Luonan
A2 - Moon, Yang-Sae
A2 - Bourgeois, Julien
A2 - Bennis, Mehdi
A2 - Li, Yu-Feng
A2 - Ha, Young-Guk
A2 - Kwon, Hyuk-Yoon
A2 - Cuzzocrea, Alfredo
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 IEEE International Conference on Big Data and Smart Computing, BigComp 2020
Y2 - 19 February 2020 through 22 February 2020
ER -