Analytical study of interfacial layer doping effect on contact resistivity in metal-interfacial layer-Ge structure
- Jeong Kyu Kim
- , Gwang Sik Kim
- , Changhwan Shin
- , Jin Hong Park
- , Krishna C. Saraswat
- , Hyun Yong Yu
- Korea University
- University of Seoul
- Stanford University
Research output: Contribution to journal › Article › peer-review
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