Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters

Chang Yeol Oh; Yun Sung Kim; Won Yong Sung; Nam Jin Cho; Byoung Kuk Lee

doi:10.1109/APEC.2014.6803287

Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters

Chang Yeol Oh
, Yun Sung Kim
, Won Yong Sung
, Nam Jin Cho
, Byoung Kuk Lee

Department of Electronic and Electrical Engineering

Sungkyunkwan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

This paper presents the analysis of the mechanism of failure modes in bi-directional phase-shift full-bridge converters, composed of MOSFET, based on the circuit operation and parameters considering parasitic components of MOSFET. In addition, the relation between circuit operation and parameters are suggested through the experimental comparison. Using the relation, the suitable ranges of parameters for the stable performance are analyzed. The design criteria of the bi-directional phase-shift full-bridge converter are presented and evaluated by the experimental verification.

Original language	English
Title of host publication	APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	43-48
Number of pages	6
ISBN (Print)	9781479923250
DOIs	https://doi.org/10.1109/APEC.2014.6803287
State	Published - 2014
Event	29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014 - Fort Worth, TX, United States Duration: 16 Mar 2014 → 20 Mar 2014

Publication series

Name	Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conference

Conference	29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014
Country/Territory	United States
City	Fort Worth, TX
Period	16/03/14 → 20/03/14

Access to Document

10.1109/APEC.2014.6803287

Cite this

Oh, C. Y., Kim, Y. S., Sung, W. Y., Cho, N. J., & Lee, B. K. (2014). Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters. In APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition (pp. 43-48). Article 6803287 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC.2014.6803287

Oh, Chang Yeol ; Kim, Yun Sung ; Sung, Won Yong et al. / Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters. APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 43-48 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

@inproceedings{4bd99b3db4d74bdabbf6ee1ac2c88b95,

title = "Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters",

abstract = "This paper presents the analysis of the mechanism of failure modes in bi-directional phase-shift full-bridge converters, composed of MOSFET, based on the circuit operation and parameters considering parasitic components of MOSFET. In addition, the relation between circuit operation and parameters are suggested through the experimental comparison. Using the relation, the suitable ranges of parameters for the stable performance are analyzed. The design criteria of the bi-directional phase-shift full-bridge converter are presented and evaluated by the experimental verification.",

author = "Oh, \{Chang Yeol\} and Kim, \{Yun Sung\} and Sung, \{Won Yong\} and Cho, \{Nam Jin\} and Lee, \{Byoung Kuk\}",

year = "2014",

doi = "10.1109/APEC.2014.6803287",

language = "English",

isbn = "9781479923250",

series = "Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "43--48",

booktitle = "APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition",

note = "29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014 ; Conference date: 16-03-2014 Through 20-03-2014",

}

Oh, CY, Kim, YS, Sung, WY, Cho, NJ & Lee, BK 2014, Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters. in APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition., 6803287, Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, Institute of Electrical and Electronics Engineers Inc., pp. 43-48, 29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014, Fort Worth, TX, United States, 16/03/14. https://doi.org/10.1109/APEC.2014.6803287

Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters. / Oh, Chang Yeol; Kim, Yun Sung; Sung, Won Yong et al.
APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition. Institute of Electrical and Electronics Engineers Inc., 2014. p. 43-48 6803287 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters

AU - Oh, Chang Yeol

AU - Kim, Yun Sung

AU - Sung, Won Yong

AU - Cho, Nam Jin

AU - Lee, Byoung Kuk

PY - 2014

Y1 - 2014

N2 - This paper presents the analysis of the mechanism of failure modes in bi-directional phase-shift full-bridge converters, composed of MOSFET, based on the circuit operation and parameters considering parasitic components of MOSFET. In addition, the relation between circuit operation and parameters are suggested through the experimental comparison. Using the relation, the suitable ranges of parameters for the stable performance are analyzed. The design criteria of the bi-directional phase-shift full-bridge converter are presented and evaluated by the experimental verification.

AB - This paper presents the analysis of the mechanism of failure modes in bi-directional phase-shift full-bridge converters, composed of MOSFET, based on the circuit operation and parameters considering parasitic components of MOSFET. In addition, the relation between circuit operation and parameters are suggested through the experimental comparison. Using the relation, the suitable ranges of parameters for the stable performance are analyzed. The design criteria of the bi-directional phase-shift full-bridge converter are presented and evaluated by the experimental verification.

UR - https://www.scopus.com/pages/publications/84900406458

U2 - 10.1109/APEC.2014.6803287

DO - 10.1109/APEC.2014.6803287

M3 - Conference contribution

AN - SCOPUS:84900406458

SN - 9781479923250

T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

SP - 43

EP - 48

BT - APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014

Y2 - 16 March 2014 through 20 March 2014

ER -

Oh CY, Kim YS, Sung WY, Cho NJ, Lee BK. Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters. In APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition. Institute of Electrical and Electronics Engineers Inc. 2014. p. 43-48. 6803287. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). doi: 10.1109/APEC.2014.6803287

Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters

Abstract

Publication series

Conference

Access to Document

Other files and links

Fingerprint

Cite this