Analysis of MOSFET failure modes in bi-directional phase-shift full-bridge converters

Chang Yeol Oh, Yun Sung Kim, Won Yong Sung, Nam Jin Cho, Byoung Kuk Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper presents the analysis of the mechanism of failure modes in bi-directional phase-shift full-bridge converters, composed of MOSFET, based on the circuit operation and parameters considering parasitic components of MOSFET. In addition, the relation between circuit operation and parameters are suggested through the experimental comparison. Using the relation, the suitable ranges of parameters for the stable performance are analyzed. The design criteria of the bi-directional phase-shift full-bridge converter are presented and evaluated by the experimental verification.

Original languageEnglish
Title of host publicationAPEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages43-48
Number of pages6
ISBN (Print)9781479923250
DOIs
StatePublished - 2014
Event29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014 - Fort Worth, TX, United States
Duration: 16 Mar 201420 Mar 2014

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conference

Conference29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014
Country/TerritoryUnited States
CityFort Worth, TX
Period16/03/1420/03/14

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