Analysis of Minimizing Techniques for Touch Current in Mobile Devices

Woon Shik Shin, Eunsu Jang, Byoung Kuk Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper proposes approaches to minimize the touch current of mobile devices. By modeling an equivalent circuit of a touch current, the cause of the touch current occurring in the mobile devices is analyzed. Through the analysis results, the circuit that minimizes the touch current is proposed. Furthermore, the validity of the proposed circuits is verified through simulation and experimental results.

Original languageEnglish
Title of host publication23rd International Conference on Electrical Machines and Systems, ICEMS 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages421-425
Number of pages5
ISBN (Electronic)9784886864192
DOIs
StatePublished - 24 Nov 2020
Externally publishedYes
Event23rd International Conference on Electrical Machines and Systems, ICEMS 2020 - Hamamatsu, Japan
Duration: 24 Nov 202027 Nov 2020

Publication series

Name23rd International Conference on Electrical Machines and Systems, ICEMS 2020

Conference

Conference23rd International Conference on Electrical Machines and Systems, ICEMS 2020
Country/TerritoryJapan
CityHamamatsu
Period24/11/2027/11/20

Keywords

  • EMI
  • Leakage current
  • Touch current
  • Y-cap

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