An experimental study on the variation of MTF and NPS caused by x-ray beam conditions for three indirect digital radiographic imagers

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Abstract

Digital radiographie x-ray imagers are increasingly used in many clinical areas. So it is important to evaluate the performance of imagers. There is growing consensus in the scientific world that the detective quantum efficiency (DQE) is the best-suited parameter for describing the imaging performance of an x-ray imaging device. DQE is calculated with modulation transfer function (MTF) and noise power spectrum (NPS). As a preliminary study, MTF and NPS of three indirect digital radiographic imagers were measured and analyzed for comparison of imager performance for three imagers. The imagers were evaluated using two standard x-ray beam qualities, RQA5 and RQA9 recommended by an international electrotechnical commission (IEC) standard. For MTF and NPS measurement, edge method and two-dimensional fourier analysis method were adopted each other. In result, the highest MTF is observed in the imager with smallest pixel pitch and preprocessing of raw data among three imagers. There is a obvious MTF difference with preprocessing steps and a little difference between RQA5 and RQA9. NNPS is also affected by preprocessing steps. There are the significant increase of noise at low frequency because of the increase of the multiplicative noise component as exposure increases except CDXI-40G (Canon). The low NPS is relatively caused by high exposure level because of noise conversion process. In comparison, the lowest NPS imager was found. The evaluation of imaging performance using DQE concept will be done as our further study.

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1960-1963
Number of pages4
ISBN (Print)1424405610, 9781424405619
DOIs
StatePublished - 2006
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: 29 Oct 20064 Nov 2006

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume3
ISSN (Print)1095-7863

Conference

Conference2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/TerritoryUnited States
CitySan Diego, CA
Period29/10/064/11/06

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