TY - GEN
T1 - An advanced TRIM command for extending lifetime of TLC NAND flash-based storage
AU - Kwon, Kirock
AU - Kang, Dong Hyun
AU - Park, Jonggyu
AU - Eom, Young Ik
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/3/29
Y1 - 2017/3/29
N2 - In mobile market, the popularity of TLC-based flash storage is steadily growing due to its high capacity. In this paper, we study the relationship between TLC-based storage and log-structured file system in terms of lifetime of the storage device. We also propose a novel technique, called Segment Trimming, which helps to eliminate the unnecessary data migration inside TLC storage. Our experimental results clearly show that our technique reduces the unnecessary data migration by 83% on average, compared with the traditional approach.
AB - In mobile market, the popularity of TLC-based flash storage is steadily growing due to its high capacity. In this paper, we study the relationship between TLC-based storage and log-structured file system in terms of lifetime of the storage device. We also propose a novel technique, called Segment Trimming, which helps to eliminate the unnecessary data migration inside TLC storage. Our experimental results clearly show that our technique reduces the unnecessary data migration by 83% on average, compared with the traditional approach.
UR - https://www.scopus.com/pages/publications/85018344656
U2 - 10.1109/ICCE.2017.7889381
DO - 10.1109/ICCE.2017.7889381
M3 - Conference contribution
AN - SCOPUS:85018344656
T3 - 2017 IEEE International Conference on Consumer Electronics, ICCE 2017
SP - 424
EP - 425
BT - 2017 IEEE International Conference on Consumer Electronics, ICCE 2017
A2 - Pescador, Fernando
A2 - Lee, Jong-Hyouk
A2 - Sanchez, Daniel Diaz
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Y2 - 8 January 2017 through 10 January 2017
ER -