All-solution-processed Si films with broadband and omnidirectional light absorption

  • Yongkook Park
  • , Hyoseong Ahn
  • , Kyu Tae Lee
  • , Ji Hyun Kim
  • , Minwoo Nam
  • , Junhee Cho
  • , Joon Soo Han
  • , Sun Kyung Kim
  • , Doo Hyun Ko

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Silicon photonic structures have attracted a great deal of attention due to their potential benefits of efficient light management in optoelectronic applications. In this paper, we demonstrate broadband optical absorption enhancement in solution-processed amorphous silicon (a-Si) by leveraging the advantages of silicon photonic structures. Graded refractive index silicon multi-layer structures are employed by modulating optical constants with simple process optimization, resulting in significantly improved reflectance over a broad range of visible wavelengths. In addition, nanopatterning flexibility of solution-processed silicon provides benefits for tailoring silicon optical properties. With the incorporation of the two-dimensional submicron pattern into silicon films, the absorptivity of silicon films improves considerably below the wavelength of the bandgap (λ ∼ 800 nm), and the limited bandwidth of absorptivity in silicon films can be extended to near-infrared wavelengths by coating with a thin gold layer. The methodology is generally applicable to a platform for improving the broadband optical absorption of photonic and optoelectronic devices.

Original languageEnglish
Article number405202
JournalNanotechnology
Volume30
Issue number40
DOIs
StatePublished - 18 Jul 2019
Externally publishedYes

Keywords

  • amorphous silicon
  • graded refractive index antireflection layers
  • nanoimprint lithography
  • nanopatterned photonic structures
  • solution processing

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