Abstract
This paper presents a new AI-based smart factory construction model for SMEs based on the Korean manufacturing industry and proposes an effective construction process that implements the informatization, automation, and intelligentization characteristics of smart factories. The Korean AI-based smart factory construction process starts with the accumulation of digital information by attaching sensors to the manufacturing processs, and then creates a customized AI model for the company through cloud accumulation of sensor data and big data analysis through CNN techniques. The Korean SME Smart Factory is an AI-based smart factory through AHP analysis and smart factory level diagnosis system, which is a construction process, which means a consumer-oriented intelligent factory that combines next-generation digital technology and manufacturing technology beyond the existing level of factory automation (FA). Various products can be produced on one production line, and modularization is expected to change from mass orders to individual flexible production systems. The transition to smart factories is expected to dramatically improve the productivity of manufacturing, as well as realize energy savings and a more human-centered work environment. By monitoring and controlling manufacturing sites in a virtual space, it is expected to facilitate factory management and lead to improved quality and cost competitiveness. Keywords: AI Smart Factory, Level Diagnosis System, Korean SMEs, AHP Analysis.
| Original language | English |
|---|---|
| Pages (from-to) | 169-179 |
| Number of pages | 11 |
| Journal | Procedia Computer Science |
| Volume | 224 |
| DOIs | |
| State | Published - 2023 |
| Event | 18th International Conference on Future Networks and Communications, FNC 2023 / 20th International Conference on Mobile Systems and Pervasive Computing, MobiSPC 2023 / 13th International Conference on Sustainable Energy Information Technology, SEIT 2023 - Halifax, Canada Duration: 14 Aug 2023 → 16 Aug 2023 |
Keywords
- Auto-Focusing
- Ellipsometer
- Machine Vision
- Semiconductor
- Wafer stage