Admittance spectroscopic analysis of organic light emitting diodes with a LiF buffer layer

Hyunmin Kim; Hyungjune Park; Junsin Yi; Semyoung Oh; Donggeun Jung

Admittance spectroscopic analysis of organic light emitting diodes with a LiF buffer layer

Hyunmin Kim, Hyungjune Park, Junsin Yi, Semyoung Oh, Donggeun Jung

Department of Electronic and Electrical Engineering

Sungkyunkwan University

Research output: Contribution to journal › Conference article › peer-review

Abstract

Admittance Spectroscopic analysis was applied to study the effect of LiF buffer layer and to model the equivalent circuit for ITO/Alq₃/LiF/Al device structure. The admittance spectroscopic analysis of the devices with LiF layer shows reduction in contact resistance (R_C), parallel resistance (R_P) and increment in parallel capacitance (C_P).

Original language	English
Pages (from-to)	1014-1017
Number of pages	4
Journal	Proceedings of International Meeting on Information Display
Volume	2006
State	Published - 2006
Event	IMID/IDMC 2006: 6th Internaional Meeting on Information Display and the 5th International Display Manufacturing Conference - Daegu, Korea, Republic of Duration: 22 Aug 2006 → 25 Aug 2006

Cite this

@article{e02074fd3f87465cad7e71899ca9bd61,

title = "Admittance spectroscopic analysis of organic light emitting diodes with a LiF buffer layer",

abstract = "Admittance Spectroscopic analysis was applied to study the effect of LiF buffer layer and to model the equivalent circuit for ITO/Alq3/LiF/Al device structure. The admittance spectroscopic analysis of the devices with LiF layer shows reduction in contact resistance (RC), parallel resistance (RP) and increment in parallel capacitance (CP).",

author = "Hyunmin Kim and Hyungjune Park and Junsin Yi and Semyoung Oh and Donggeun Jung",

year = "2006",

language = "English",

volume = "2006",

pages = "1014--1017",

journal = "Proceedings of International Meeting on Information Display",

issn = "1738-7558",

note = "IMID/IDMC 2006: 6th Internaional Meeting on Information Display and the 5th International Display Manufacturing Conference ; Conference date: 22-08-2006 Through 25-08-2006",

}

TY - JOUR

T1 - Admittance spectroscopic analysis of organic light emitting diodes with a LiF buffer layer

AU - Kim, Hyunmin

AU - Park, Hyungjune

AU - Yi, Junsin

AU - Oh, Semyoung

AU - Jung, Donggeun

PY - 2006

Y1 - 2006

N2 - Admittance Spectroscopic analysis was applied to study the effect of LiF buffer layer and to model the equivalent circuit for ITO/Alq3/LiF/Al device structure. The admittance spectroscopic analysis of the devices with LiF layer shows reduction in contact resistance (RC), parallel resistance (RP) and increment in parallel capacitance (CP).

AB - Admittance Spectroscopic analysis was applied to study the effect of LiF buffer layer and to model the equivalent circuit for ITO/Alq3/LiF/Al device structure. The admittance spectroscopic analysis of the devices with LiF layer shows reduction in contact resistance (RC), parallel resistance (RP) and increment in parallel capacitance (CP).

UR - https://www.scopus.com/pages/publications/33846177558

M3 - Conference article

AN - SCOPUS:33846177558

SN - 1738-7558

VL - 2006

SP - 1014

EP - 1017

JO - Proceedings of International Meeting on Information Display

JF - Proceedings of International Meeting on Information Display

T2 - IMID/IDMC 2006: 6th Internaional Meeting on Information Display and the 5th International Display Manufacturing Conference

Y2 - 22 August 2006 through 25 August 2006

ER -

Admittance spectroscopic analysis of organic light emitting diodes with a LiF buffer layer

Abstract

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