A test framework for the accuracy of line detection by hough transforms

Thuy Tuong Nguyen, Pham Dai Xuan, Dongkyun Kim, Wook Jeon Jae

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

The detection of lines in an image is an important task. In the fact that many works have been done on line extraction, there is a lack of a comprehensive comparison of the so far proposed algorithms. The design and implementation of a framework to test line detection algorithms on intensity images is described in this paper. Our test framework is applied to compare the correctness and precision of lines extracted by Standard Hough Transform, Progressive Probabilistic Hough Transform and a proposed method based on Standard Hough Transform. The correctness of the extracted lines relates to global accuracy whereas the precision concerns accuracy at a local level. The well-known Standard Hough Transform (SHT) and Progressive Probabilistic Hough Transform (PPHT) are two of the most efficient algorithms for line detection. SHT can detect almost straight lines in the image, and it is highly resistant to noise. Line segments are effectively found by PPHT. However, this algorithm has lower accuracy than SHT. The proposed method based on SHT overcomes this. It contains three extensions: the technique of accumulation, the application of a local maxima rule, and the detection of line segments. The test framework enables us to evaluate the advantages and disadvantages of the three Hough Transform algorithms by analyzing the results of line extraction.

Original languageEnglish
Title of host publicationProceedings - IEEE INDIN 2008
Subtitle of host publication6th IEEE International Conference on Industrial Informatics
Pages1528-1533
Number of pages6
DOIs
StatePublished - 2008
EventIEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics - Daejeon, Korea, Republic of
Duration: 13 Jul 200816 Jul 2008

Publication series

NameIEEE International Conference on Industrial Informatics (INDIN)
ISSN (Print)1935-4576

Conference

ConferenceIEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics
Country/TerritoryKorea, Republic of
CityDaejeon
Period13/07/0816/07/08

Fingerprint

Dive into the research topics of 'A test framework for the accuracy of line detection by hough transforms'. Together they form a unique fingerprint.

Cite this