Abstract
Nitrogen-doped thiophene plasma polymer [N-ThioPP] thin films were deposited by radio frequency (13.56 MHz) plasma-enhanced chemical vapor deposition method. Thiophene was used as organic precursor (carbon source) with hydrogen gas as the precursor bubbler gas. Additionally, nitrogen gas [N2] was used as nitrogen dopant. Furthermore, additional argon was used as a carrier gas. The as-grown polymerized thin films were analyzed using ellipsometry, Fourier-transform infrared [FT-IR] spectroscopy, Raman spectroscopy, and water contact angle measurement. The ellipsometry results showed the refractive index change of the N-ThioPP film. The FT-IR spectra showed that the N-ThioPP films were completely fragmented and polymerized from thiophene.
| Original language | English |
|---|---|
| Article number | 62 |
| Journal | Nanoscale Research Letters |
| Volume | 7 |
| DOIs | |
| State | Published - 2012 |
Keywords
- Chemical properties
- N-ThioPP
- Optical
- PECVD
- Physical
- Plasma polymer
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