Abstract
In this study, an indium gallium zinc oxide (IGZO) thin-film transistor (TFT) based on Yttrium-doped ZrO2 dielectric was studied. We revealed that a-IGZO/1:8 Y-doped ZrO2 TFT deteriorated compared to a-IGZO/ZrO2 TFT. On the other hand, a-IGZO/1:2 Y-doped ZrO2 TFT had better overall properties than a-IGZO/ ZrO2 TFT.
| Original language | English |
|---|---|
| Pages (from-to) | 354-357 |
| Number of pages | 4 |
| Journal | Proceedings of the International Display Workshops |
| Volume | 29 |
| State | Published - 2022 |
| Externally published | Yes |
| Event | 29th International Display Workshops, IDW 2022 - Fukuoka, Japan Duration: 14 Dec 2022 → 16 Dec 2022 |
Keywords
- a-IGZO TFT
- High-k
- Solution Process
- Y-doped ZrO2