A Study of High-Voltage p-Type MOSFET Degradation under AC Stress
- Dongjun Lee
- , Chungje Na
- , Chiwoo Lee
- , Changsub Lee
- , Sunghoi Hur
- , Duheon Song
- , Junghyuk Choi
- , Byoungdeog Choi
- Sungkyunkwan University
- Samsung
Research output: Contribution to journal › Article › peer-review
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