A novel structure and process for improving image sticking

Jung Woo Lee, Hyun Seok Hong, Ki Suck Cha, Jung Young Lee, Bae Won Lee, Junsin Yi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Image Sticking caused by the spatial difference of photo leakage current in a-Si:H TFT LCDs has been investigated and improved. When a mosaic pattern which is a image sticking pattern in TFT LCDs is displayed repeatedly over a long time, Image Sticking is shown in case a-Si:H TFT's leakage currents of white pattern and black pattern are different. After being displayed long time, the photo leakage currents of black pattern region are lower than white pattern region. This phenomenon has been investigated physically and electrically. There is no Image Sticking at proposed TFT pixel and process architecture.

Original languageEnglish
Title of host publicationEURODISPLAY-2007 - Proceedings of the 27th International Display Research Conference
Pages292-294
Number of pages3
StatePublished - 2007
EventEURODISPLAY-2007 - 27th International Display Research Conference - Moscow, Russian Federation
Duration: 18 Sep 200722 Sep 2007

Publication series

NameSID Conference Record of the International Display Research Conference
ISSN (Print)1083-1312

Conference

ConferenceEURODISPLAY-2007 - 27th International Display Research Conference
Country/TerritoryRussian Federation
CityMoscow
Period18/09/0722/09/07

Keywords

  • a-Si:H TFT
  • Image Sticking
  • Instability
  • Photo leakage current

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