A novel a-IGZO TFT scan driver circuit using only one pull-down transistor

Jungwoo Lee; Jae Hong Jeon; Kee Chan Park; Soo Yeon Lee; Yong Sang Kim

A novel a-IGZO TFT scan driver circuit using only one pull-down transistor

Jungwoo Lee, Jae Hong Jeon, Kee Chan Park, Soo Yeon Lee, Yong Sang Kim

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper proposes new scan driver to prevent output ripple voltage which can be generated by CLK. Using only one pull-down TFT with 50% turn-on duty ratio, proposed circuit can obtain both high reliability for continuous bias stress and fully cut-off ripple voltage by using negative VGS for pull-up TFT.

Original language	English
Pages (from-to)	868-871
Number of pages	4
Journal	Proceedings of the International Display Workshops
Volume	27
State	Published - 9 Dec 2021
Externally published	Yes
Event	27th International Display Workshops, IDW 2020 - Virtual, Online Duration: 9 Dec 2020 → 11 Dec 2020

Keywords

A-IGZO TFT
Depletion Mode
Pull-Down TFT
Reliability
Scan Driver Circuit

Cite this

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title = "A novel a-IGZO TFT scan driver circuit using only one pull-down transistor",

abstract = "This paper proposes new scan driver to prevent output ripple voltage which can be generated by CLK. Using only one pull-down TFT with 50\% turn-on duty ratio, proposed circuit can obtain both high reliability for continuous bias stress and fully cut-off ripple voltage by using negative VGS for pull-up TFT.",

keywords = "A-IGZO TFT, Depletion Mode, Pull-Down TFT, Reliability, Scan Driver Circuit",

author = "Jungwoo Lee and Jeon, \{Jae Hong\} and Park, \{Kee Chan\} and Lee, \{Soo Yeon\} and Kim, \{Yong Sang\}",

note = "Publisher Copyright: {\textcopyright} 2020 ITE and SID.; 27th International Display Workshops, IDW 2020 ; Conference date: 09-12-2020 Through 11-12-2020",

year = "2021",

month = dec,

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T1 - A novel a-IGZO TFT scan driver circuit using only one pull-down transistor

AU - Lee, Jungwoo

AU - Jeon, Jae Hong

AU - Park, Kee Chan

AU - Lee, Soo Yeon

AU - Kim, Yong Sang

PY - 2021/12/9

Y1 - 2021/12/9

N2 - This paper proposes new scan driver to prevent output ripple voltage which can be generated by CLK. Using only one pull-down TFT with 50% turn-on duty ratio, proposed circuit can obtain both high reliability for continuous bias stress and fully cut-off ripple voltage by using negative VGS for pull-up TFT.

AB - This paper proposes new scan driver to prevent output ripple voltage which can be generated by CLK. Using only one pull-down TFT with 50% turn-on duty ratio, proposed circuit can obtain both high reliability for continuous bias stress and fully cut-off ripple voltage by using negative VGS for pull-up TFT.

KW - A-IGZO TFT

KW - Depletion Mode

KW - Pull-Down TFT

KW - Reliability

KW - Scan Driver Circuit

UR - https://www.scopus.com/pages/publications/85119954307

M3 - Conference article

AN - SCOPUS:85119954307

SN - 1883-2490

VL - 27

SP - 868

EP - 871

JO - Proceedings of the International Display Workshops

JF - Proceedings of the International Display Workshops

T2 - 27th International Display Workshops, IDW 2020

Y2 - 9 December 2020 through 11 December 2020

ER -

A novel a-IGZO TFT scan driver circuit using only one pull-down transistor

Abstract

Keywords

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