A New Integrated Scan/Emission Driver Circuit with Progressive Emission Driving Method for Micro-LED Display

Sung Hyuck Ahn; Eun Kyo Jung; Yong Hoo Hong; Hwarim Im; Yong Sang Kim

doi:10.1002/sdtp.15721

A New Integrated Scan/Emission Driver Circuit with Progressive Emission Driving Method for Micro-LED Display

Sung Hyuck Ahn, Eun Kyo Jung, Yong Hoo Hong, Hwarim Im, Yong Sang Kim

Sungkyunkwan University

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this paper, we proposed an a-IGZO TFT-based integrated scan/emission driver circuit. The proposed circuit can be applied to micro-LED pixel circuit using the progressive emission method. Each circuit is designed to prevent leakage current in the depletion mode by using series two transistors (STT) structures, two low supply voltages.

Original language	English
Pages (from-to)	1208-1211
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	53
Issue number	1
DOIs	https://doi.org/10.1002/sdtp.15721
State	Published - 2022
Externally published	Yes
Event	59th International Symposium, Seminar and Exhibition, Display Week 2022 - San Jose, United States Duration: 8 May 2022 → 13 May 2022

Keywords

Depletion mode
Emission driver circuit
Leakage Current
Micro-LED Display
Scan driver circuit

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10.1002/sdtp.15721

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title = "A New Integrated Scan/Emission Driver Circuit with Progressive Emission Driving Method for Micro-LED Display",

abstract = "In this paper, we proposed an a-IGZO TFT-based integrated scan/emission driver circuit. The proposed circuit can be applied to micro-LED pixel circuit using the progressive emission method. Each circuit is designed to prevent leakage current in the depletion mode by using series two transistors (STT) structures, two low supply voltages.",

keywords = "Depletion mode, Emission driver circuit, Leakage Current, Micro-LED Display, Scan driver circuit",

author = "Ahn, \{Sung Hyuck\} and Jung, \{Eun Kyo\} and Hong, \{Yong Hoo\} and Hwarim Im and Kim, \{Yong Sang\}",

note = "Publisher Copyright: {\textcopyright} 2022. John Wiley and Sons Inc. AIAA. All rights reserved.; 59th International Symposium, Seminar and Exhibition, Display Week 2022 ; Conference date: 08-05-2022 Through 13-05-2022",

year = "2022",

doi = "10.1002/sdtp.15721",

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T1 - A New Integrated Scan/Emission Driver Circuit with Progressive Emission Driving Method for Micro-LED Display

AU - Ahn, Sung Hyuck

AU - Jung, Eun Kyo

AU - Hong, Yong Hoo

AU - Im, Hwarim

AU - Kim, Yong Sang

PY - 2022

Y1 - 2022

N2 - In this paper, we proposed an a-IGZO TFT-based integrated scan/emission driver circuit. The proposed circuit can be applied to micro-LED pixel circuit using the progressive emission method. Each circuit is designed to prevent leakage current in the depletion mode by using series two transistors (STT) structures, two low supply voltages.

AB - In this paper, we proposed an a-IGZO TFT-based integrated scan/emission driver circuit. The proposed circuit can be applied to micro-LED pixel circuit using the progressive emission method. Each circuit is designed to prevent leakage current in the depletion mode by using series two transistors (STT) structures, two low supply voltages.

KW - Depletion mode

KW - Emission driver circuit

KW - Leakage Current

KW - Micro-LED Display

KW - Scan driver circuit

UR - https://www.scopus.com/pages/publications/85135622971

U2 - 10.1002/sdtp.15721

DO - 10.1002/sdtp.15721

M3 - Conference article

AN - SCOPUS:85135622971

SN - 0097-966X

VL - 53

SP - 1208

EP - 1211

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

T2 - 59th International Symposium, Seminar and Exhibition, Display Week 2022

Y2 - 8 May 2022 through 13 May 2022

ER -

A New Integrated Scan/Emission Driver Circuit with Progressive Emission Driving Method for Micro-LED Display

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Keywords

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