A microstructural map of crystallized NiTi thin film derived from in situ TEM methods

Hoo Jeong Lee; Hai Ni; David T. Wu; Ainissa G. Ramirez

doi:10.2320/matertrans.47.527

A microstructural map of crystallized NiTi thin film derived from in situ TEM methods

Hoo Jeong Lee
, Hai Ni
, David T. Wu
, Ainissa G. Ramirez

Department of Advanced Materials Science and Engineering

Yale University

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

Sputtered-deposited nickel titanium thin films are commonly amorphous when synthesized and require annealing to crystallize them. The resulting microstructures, which are governed by nucleation and growth kinetics, dictate the actuation properties. The evolution of these microstructures was studied using in situ transmission electron microscopy (TEM) heating methods. The experimentally-determined kinetic values of nucleation and growth were inserted into a mathematical expression derived from the Johnson-Mehl-Avrami-Kolmogorov (JMAK) theory, which predicts the average grain size over a broad range of temperatures.

Original language	English
Pages (from-to)	527-531
Number of pages	5
Journal	Materials Transactions
Volume	47
Issue number	3
DOIs	https://doi.org/10.2320/matertrans.47.527
State	Published - Mar 2006

Keywords

Avrami model
Crystallization
In situ transmission electron microsopy (TEM)
Kinetics
Martensitic transformation
NiTi
Shape memory alloys
Thin films

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10.2320/matertrans.47.527

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title = "A microstructural map of crystallized NiTi thin film derived from in situ TEM methods",

abstract = "Sputtered-deposited nickel titanium thin films are commonly amorphous when synthesized and require annealing to crystallize them. The resulting microstructures, which are governed by nucleation and growth kinetics, dictate the actuation properties. The evolution of these microstructures was studied using in situ transmission electron microscopy (TEM) heating methods. The experimentally-determined kinetic values of nucleation and growth were inserted into a mathematical expression derived from the Johnson-Mehl-Avrami-Kolmogorov (JMAK) theory, which predicts the average grain size over a broad range of temperatures.",

keywords = "Avrami model, Crystallization, In situ transmission electron microsopy (TEM), Kinetics, Martensitic transformation, NiTi, Shape memory alloys, Thin films",

author = "Lee, \{Hoo Jeong\} and Hai Ni and Wu, \{David T.\} and Ramirez, \{Ainissa G.\}",

year = "2006",

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doi = "10.2320/matertrans.47.527",

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volume = "47",

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AU - Lee, Hoo Jeong

AU - Ni, Hai

AU - Wu, David T.

AU - Ramirez, Ainissa G.

PY - 2006/3

Y1 - 2006/3

N2 - Sputtered-deposited nickel titanium thin films are commonly amorphous when synthesized and require annealing to crystallize them. The resulting microstructures, which are governed by nucleation and growth kinetics, dictate the actuation properties. The evolution of these microstructures was studied using in situ transmission electron microscopy (TEM) heating methods. The experimentally-determined kinetic values of nucleation and growth were inserted into a mathematical expression derived from the Johnson-Mehl-Avrami-Kolmogorov (JMAK) theory, which predicts the average grain size over a broad range of temperatures.

AB - Sputtered-deposited nickel titanium thin films are commonly amorphous when synthesized and require annealing to crystallize them. The resulting microstructures, which are governed by nucleation and growth kinetics, dictate the actuation properties. The evolution of these microstructures was studied using in situ transmission electron microscopy (TEM) heating methods. The experimentally-determined kinetic values of nucleation and growth were inserted into a mathematical expression derived from the Johnson-Mehl-Avrami-Kolmogorov (JMAK) theory, which predicts the average grain size over a broad range of temperatures.

KW - Avrami model

KW - Crystallization

KW - In situ transmission electron microsopy (TEM)

KW - Kinetics

KW - Martensitic transformation

KW - NiTi

KW - Shape memory alloys

KW - Thin films

UR - https://www.scopus.com/pages/publications/33646854750

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DO - 10.2320/matertrans.47.527

M3 - Article

AN - SCOPUS:33646854750

SN - 1345-9678

VL - 47

SP - 527

EP - 531

JO - Materials Transactions

JF - Materials Transactions

IS - 3

ER -

A microstructural map of crystallized NiTi thin film derived from in situ TEM methods

Abstract

Keywords

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